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Software Failure Investigation: A Near-Miss Analysis Approach Software Failure Investigation: A Near-Miss Analysis Approach by Jan Eloff,Madeleine Bihina Bella

Software Failure Investigation: A Near-Miss Analysis Approach

by Jan Eloff,Madeleine Bihina Bella


ISBN 13: 9783319613338

Format: Hardcover (132 pages)
Publisher: Springer
Published: 18 Sep 2017

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Information Security: 17th International Conference, ISSA 2018, Pretoria, South Africa, August 15–16, 2018, Revised Selected Papers: 973 (Communications in Computer and Information Science, 973) Information Security: 17th International Conference, ISSA 2018, Pretoria, South Africa, August 15–16, 2018, Revised Selected Papers: 973 (Communications in Computer and Information Science, 973) by Hein Venter,Marianne Loock,Marijke Coetzee,Mariki Eloff,Jan Eloff

Information Security: 17th International Conference, ISSA 2018, Pretoria, South Africa, August 15–16, 2018, Revised Selected Papers: 973 (Communications in Computer and Information Science, 973)

by Hein Venter,Marianne Loock,Marijke Coetzee,Mariki Eloff,Jan Eloff


ISBN 13: 9783030114060

Format: Paperback (209 pages)
Publisher: Springer
Published: 25 Jan 2019

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Information and Cyber Security: 19th International Conference, ISSA 2020, Pretoria, South Africa, August 25–26, 2020, Revised Selected Papers: 1339 ... in Computer and Information Science, 1339) Information and Cyber Security: 19th International Conference, ISSA 2020, Pretoria, South Africa, August 25–26, 2020, Revised Selected Papers: 1339 ... in Computer and Information Science, 1339) by Hein Venter,Marianne Loock,Marijke Coetzee,Mariki Eloff,Jan Eloff,Reinhardt Botha

Information and Cyber Security: 19th International Conference, ISSA 2020, Pretoria, South Africa, August 25–26, 2020, Revised Selected Papers: 1339 ... in Computer and Information Science, 1339)

by Hein Venter,Marianne Loock,Marijke Coetzee,Mariki Eloff,Jan Eloff,Reinhardt Botha


ISBN 13: 9783030660383

Format: Paperback (176 pages)
Publisher: Springer
Published: 19 Dec 2020

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